Cube Hot/Cold Functional Test Systems
Compact chamber systems for hot functional testing (60–155 °C) and cold functional testing (−50 to −10 °C) with cycle times as short as 15 seconds.
Product Overview
The SMT Wertheim Cube systems are purpose-built compact chambers for hot and cold functional testing of electronic components and assemblies. The hot functional test configuration operates from 60 °C to 155 °C, while the cold functional test variant covers −50 °C to −10 °C, with additional cooling-to-room-temperature capability. Engineered for high throughput, the Cube achieves cycle times as short as 15 seconds, making it suitable for inline production testing at volume. The single-location loading and unloading design simplifies integration with manual operators or automated handling systems. Built-in traceability ensures full documentation of every test cycle for quality assurance and regulatory compliance, particularly critical for medical, automotive, communication, and industrial electronics. The compact footprint allows placement directly within the production line without consuming valuable floor space. Distributed and supported by TIIHTRONICS across Mexico and Texas.
Key Features
- Hot functional test range: 60 °C to 155 °C
- Cold functional test range: −50 °C to −10 °C
- Cooling to room temperature capability
- Cycle times as short as 15 seconds
- Single-location loading and unloading
- Manual or automated integration
- Built-in traceability for full test documentation
- Compact footprint for inline placement
- Product reliability enhancement via temperature testing
- Suitable for medical, automotive, and communication electronics
- Backed by TIIHTRONICS local service and support
Technical Specifications
| Hot Test Range | 60 °C to 155 °C |
| Cold Test Range | −50 °C to −10 °C |
| Minimum Cycle Time | 15 seconds |
| Loading | Single-location load/unload |
| Integration | Manual or automated |
| Traceability | Integrated |
| Target Industries | Medical, automotive, communication, industrial |
